The Beam Analyzer is based on a knife-edge beam profiler technology that will generate the profile by using a single detector, sensitive to from UV to 2700 nm depending on the sensor used. The mechanical scanner will obstruct the light striking the detector as a function of its rotational speed. The amount of light reaching the detector is modulated by mechanical means while adequate data processing measures the laser beam profile. Our company developed an enabling mechanical scanning technology, presenting a 3D reconstruction of the beam based upon a combination of computer and knife edge tomography.
The result is an instrument capable of 3D measuring of minute beams (down to one micron) and currently up to 10 mm, without any optical magnification or reduction. The outlines of this technology create clear power distribution along the laser propagation axis at wavelengths where mosaic images devices are not available. For example, a new 10 mm single detector size of indium gallium arsenide enables measurement of small and large beams at a wavelengths range starting from 600 nm up to 2.7 μm in special cases. Sub-micron measuring resolution is achieved by this technology.