LAM Beam Analyzer | Laser Additive Manufacturing Beam Analyzer

Camera Type

CCD 1/4" format, with 470,000 pixels

Spectral Range

350-1310 nm

Magnification

Infinite conjugate objectives: x100, x50, x20, x10, x5

Minimum Measurable Beam Size

0.5 μm for x100 objective

Max. Frame Rate

25 Hz

Interface

USB2.0 interface, windows XP/7/8/10 (32 & 64 bit)

New instrument especially designed for LAM – Laser Additive Manufacturing. Measuring critical parameters such as beam size, accurate beam position and power.

When positioned on a tabletop, a beam  focused on this surface will be measured for power, position accuracy and beam size. This tool could be very useful for QA and built-in real time measurement.

The LAM Beam Analyzer offers these capabilities in a compact and versatile unit, which is air-cooled by external pressurized air – without water.  Built-in beam dump. High precision beam full characterization diagnostics for CW lasers up to 4 kWatts. Wide dynamic range, beam size measurements down to several microns and up to 9 mm.

This is a complete system specially suitable for installation as a part of LAM machine or for offline applications, and is intended for measurements over a relatively short period of time (a few seconds depending on the maximum power applied).

New instrument especially designed for LAM – Laser Additive Manufacturing. Measuring critical parameters such as beam size, accurate beam position and power.

When positioned on a tabletop, a beam  focused on this surface will be measured for power, position accuracy and beam size. This tool could be very useful for QA and built-in real time measurement.

The LAM Beam Analyzer offers these capabilities in a compact and versatile unit, which is air-cooled by external pressurized air – without water.  Built-in beam dump.

High precision beam full characterization diagnostics for CW lasers up to 4 kWatts.

Wide dynamic range, beam size measurements down to several microns and up to 9 mm.

This is a complete system specially suitable for installation as a part of LAM machine or for offline applications, and is intended for measurements over a relatively short period of time (a few seconds depending on the maximum power applied).

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