MESO Metrology System
MESO Metrology System
MESO Metrology System
MESO Metrology SystemMESO Metrology System
MESO Photonics West

MESO | Wavefront Metrology System for Interferometry Applications

Integration

Horizontal or Vertical

Optical Zoom

From 1,5’’ (38,1 mm) up to 6’’ (152 mm)

Testing Wavelength

Custom : 405 nm, 488 nm, 520 nm, 635 nm, 785 nm, 830 nm and/or 1064 nm

Resolution

680 x 500 phase points

Minimum Acquisition Time

27 us

Dimensions

63 x 30 x 45 cm

MESO, a Wavefront Metrology System with unique capabilities

The Meso Wavefront Metrology System is an easy at-wavelength instrument used for testing flat surfaces in any environment. This unique new at-wavelength instrument allows multiple achromatic wavelength measurements. Additionally, thanks to its internal zoom, it allows  characterization of a whole range optics without resolution loss, from 1.5  to 6 inches diameter.

Loaded with innovation

  • LIFT-enhanced high wavefront sensing resolution
  • POP-patent pending procedure for the testing of (thin) plane parallel optics
  • Insensitive to reflections from sample back surface

Key Features:

  • Insensitive to vibrations​
  • At-design wavelength testing​
  • Insensitive to reflections from sample back surface
  • Smart maintenance

Achromatic wavefront metrology 405- 1064 nm

Software: WAVESURF™ Easy-to-use Interface

In just a few clicks, operators and engineers in manufacturing environments can perform wavefront and surface characterization of flat optics and large lenses. With scripted testing procedures to guide users, using Wavesurf makes control easy, automated, and error-proof.

 

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The MESO Wavefront Metrology System is an easy at-wavelength instrument used for testing flat surfaces in any environment. (Testing diameter ranges from 1,5’’ to 6’.”)

MESO Wavefront Metrology system is a one-stop solution to many challenges in optical metrology. Shop floor measurements ensure quality control testing and in situ process control of your flat optics right next to the manufacturing line.

This unique new at-wavelength instrument allows several achromatism-free wavelength measurements. Additionally, it allows whole range characterization of optics without resolution loss.

MESO Wavefront Metrology System is loaded with innovation:

First. LIFT-enhanced high wavefront sensing resolution
Second. POP-patent pending procedure for the testing of (thin) plane parallel optics
Third. Spot Tracker™ proprietary technology provides absolute measurement of tilt and wavefront

KEY FEATURES​

  • Insensitive to vibrations​
  • At-design wavelength testing​
  • Insensitive to reflections from sample back surface​​

​APPLICATIONS​

Additionally, MESO is also the perfect testing tool for the control of:

  • Parallel Optics
  • Screens
  • Filters, dichroics
  • Mirrors
  • Beamsplitters
  • Windows
  • Substrates
  • Corner cubes
  • Crystals
  • Rods, Disks
  • Glass wafers
  • Displays
  • Machined surfaces
  • Windshields
  • Prisms
  • Large lenses
  • Optical systems
  • Beam expanders

​KEY SPECS of MESO metrology system

  • Horizontal or vertical integration
  • Optical zoom from 1,5’’ (38,1mm) up to 6’’ (152mm)
  • Testing wavelength from 405nm to 1064nm
  • 680 x 500 phase points resolution
  • 27us minimum acquisition time

WAVESURF supportive Software used for MESO metrology system​

​Wavesurf allows operators and engineers in manufacturing environments to perform wavefront and surface characterization of flat optics and large lenses with just a few clicks. To that end, scripted testing procedures guide users through all the steps. Additionally, MESO Metrology System makes control easy, automated and error-proof.

KEY SPECS​ for MESO Wavefront Metrology System

  • Touchscreen interface control
  • Scripted testing procedures guide the user through all the steps
  • Automated control of up to 4 embedded wavelengths​
  • Automated control of test diameter​
  • Complete automated test report​
  • ISO10110 standard compliance​​
  • Multiformat data export

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