MESO Optical Metrology System for plane parallel optics
MESO Optical Metrology System for plane parallel optics
MESO Metrology System
MESO Metrology SystemMESO Metrology System
MESO optical metrology system with sample in front

MESO | Multi-Wavelength Interference-Free Optical Metrology System

Integration

Horizontal or Vertical

Optical Zoom

From 1,5’’ (38,1 mm) up to 6’’ (152 mm)

Testing Wavelength

Custom : 405 nm, 488 nm, 520 nm, 635 nm, 785 nm, 830 nm and/or 1064 nm

Resolution

680 x 500 phase points

Minimum Acquisition Time

27 us

Dimensions

63 x 30 x 45 cm