The MESO Wavefront Metrology System is an easy at-wavelength instrument used for testing flat surfaces in any environment. (Testing diameter ranges from 1,5’’ to 6’.”)
MESO Wavefront Metrology system is a one-stop solution to many challenges in optical metrology. Shop floor measurements ensure quality control testing and in situ process control of your flat optics right next to the manufacturing line.
This unique new at-wavelength instrument allows several achromatism-free wavelength measurements. Additionally, it allows whole range characterization of optics without resolution loss.
MESO Wavefront Metrology System is loaded with innovation:
First. LIFT-enhanced high wavefront sensing resolution
Second. POP-patent pending procedure for the testing of (thin) plane parallel optics
Third. Spot Trackerâ„¢ proprietary technology provides absolute measurement of tilt and wavefront
KEY FEATURES​
- Insensitive to vibrations​
- At-design wavelength testing​
- Insensitive to reflections from sample back surface​​
​APPLICATIONS​
Additionally, MESO is also the perfect testing tool for the control of:
- Parallel Optics
- Screens
- Filters, dichroics
- Mirrors
- Beamsplitters
- Windows
- Substrates
- Corner cubes
- Crystals
- Rods, Disks
- Glass wafers
- Displays
- Machined surfaces
- Windshields
- Prisms
- Large lenses
- Optical systems
- Beam expanders
​KEY SPECS of MESO metrology system
- Horizontal or vertical integration
- Optical zoom from 1,5’’ (38,1mm) up to 6’’ (152mm)
- Testing wavelength from 405nm to 1064nm
- 680 x 500 phase points resolution
- 27us minimum acquisition time
WAVESURF supportive Software used for MESO metrology system​
​Wavesurf allows operators and engineers in manufacturing environments to perform wavefront and surface characterization of flat optics and large lenses with just a few clicks. To that end, scripted testing procedures guide users through all the steps. Additionally, MESO Metrology System makes control easy, automated and error-proof.
KEY SPECS​ for MESO Wavefront Metrology System
- Touchscreen interface control
- Scripted testing procedures guide the user through all the steps
- Automated control of up to 4 embedded wavelengths​
- Automated control of test diameter​
- Complete automated test report​
- ISO10110 standard compliance​​
- Multiformat data export
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White Papers:
- MESO White Paper At Wavelength Metrology
- MESO White Paper Parallel Optics Testing
- MESO White Paper Shop Floor Measurement