RFLEX 2 I Wavefront Metrology System

RFLEX 2 – Flexible self illuminated wavefront metrology system for optical characterization and alignment

RFLEX 2 wavefont metrology systems are made of a HASO Shack-Hartmann wavefront sensor, a collimator and a focusing module. Therefore, the RFLEX 2 provides users with a versatile and turnkey solution for precision characterization of optical systems and surfaces. The standard accuracy is of λ/100 RMS (λ/200 RMS in double pass configurations). It is insensite to vibrations or atmospheric turbulences so users can perform measurements that meet the most stringent requirements for reliable, repeatable results. Even more, accuracy can be further increased if the measured aberration is close to the diffraction limit.

Because different users have different needs, the f/# of the RFLEX2 wavefront metrology system can be adapted to each user’s requirements by choosing the focusing module best suited for the task at hand. As the sample f/# defines the best focusing module, Imagine Optic offers factory models that are available from f/#=1 to f/#=15 to ensure maximum sampling points, whereas custom models for special needs can equally be delivered.

Characterizing large optical components or complex systems is performed easily as the exit beam is divergent, thereby allowing users to set to focal spot to any point. When set at the centre of concave mirrors, surface defects can be measured and analyzed.

The RFLEX2 wavefront metrology sytstem is delivered with WaveView, its wavefront measurement and analysis dedicated software that runs under Windows 10. It displays aberrations in real-time so that users can immediately see the effects of various positioning or alignment adjustments.

Manufacturer’s website: www.imagine-optic.com

The RFLEX 2 wavefront metrology system is compatible with all our wavefront sensors: here. 

RFLEX 2 

• Wavefront characterization of optical systems in double-pass and single pass configuration
• Optical surfaces inspections
• Characterization of chromatic aberrations
• Telescope alignment and determination of best focal plane
• MTF and polychromatic MTF measurement
• Alignment of complex optical systems

R FLEX 2 SWIR 

• Analyze the transmitted wavefront of optical systems with double-pass configuration
• Characterize optical surfaces
• Characterize chromatic aberrations
• Telescope alignment and wavefront error measurement

Accessories

Translation stages

Our ΘXΘY rotation stage for angular alignment or the 5-axis stage that provides 2-way rotation around X and Y axes as well as 3-way translation along X, Y and Z axes is a perfect complement to the HASO R-Flex system.

Software add-on

HASO R-Flex is delivered with WaveView software, which is a leading wavefront metrology software providing 180 independent features. We also offer optional software modules including MTF (Modulation Transfer Function) and PSF (Point Spread Function) that increase the functionality of HASO R-Flex system.

Reference mirrors

Spherical reference mirror (Ø20mm useful pupil, R=15mm, F/0.75) for the calibration of HASO R-Flex in double-pass measurement configuration Flat reference mirror for autocollimation. Several options are available in diameter and flatness.

Single-Mode Laser Source (SMLS)

For those who want to use their HASO R-Flex at different wavelengths, we provide additional single-mode diode lasers to further expand the versatility of the system. Please contact us if you prefer to use your own light source.