RFLEX 2 wavefront metrology system
RFLEX 2 wavefront metrology system
RFLEX 2 wavefront metrology system
RFLEX 2 - wavefront metrology system setups

RFLEX 2 I Wavefront Metrology System

Spectral Bandwidth

400 - 1100 nm / 1100 - 1700 nm

F/#

from 0.87 up to 63

Sampling points

Up to 21,000 / 1280

Accuracy

λ/200

Acquisition frequency

Up to 1 kHz / 150 Hz