Microscopy beyond the visible

The HD-SWIR Digital Microscope is designed to “see” beyond what a standard optical microscope can image.  Combining SWIR coated optics, a SWIR illumination and a high resolution SWIR InGaAs camera with 5 µm pixel pitch, the HD-SWIR microscope is a cost effective and modular solution that can image microscopic samples in the visible and the shortwave infrared region (400 to 1700 nm). A variety of filter options allow imaging both visible and SWIR (400 – 1700 nm), SWIR only (900 – 1700 nm) or to focus on a spectral band or specific wavelength of interest.

Some materials are transparent in the SWIR while being opaque in the visible spectrum. For example, silicon is opaque under normal light but is transparent in the SWIR wavelengths. Therefore, .the interiors of silicon based devices can be inspected with enhanced contrast without having to disassemble them.

SWIR-optimized optics for high transmission

All optics used in the microscope are anti-reflective coatings for optimal transmission in the SWIR wavelengths.

Modular design for either coaxial illumination or transmitted light microscopy

A fibered halogen lamp with adjustable power output is offered for application requiring coaxial illumination of the sample directly through the optics.

Alternatively, a single-LED light can be used when a strong illumination at a specific SWIR wavelength is needed.

The right filter for each application

High-transmission longpass, bandpass and narrow-band filter options are available and can be inserted directly in the C-mount of the camera, right in front of the sensor.

Longpass filters: >920 nm, >1000 nm, >1070 nm, >1475 nm

Bandpass filters: 930 – 1030 nm or 1485 – 1645 nm

Narrow-band filters:  1290 – 1310 nmm , 1440 – 1460 nm or 1540 – 1560 nm

From the lab to industrial environment

The tabletop design for the lab

A  complete benchtop system with a stand, coarse and fine focus adjustment and an optional X/Y translation mount for holding the sample

The industrial design for integration

Easy integration thanks to a metric or imperial clamp mount. The long working distance of the objective (>30 mm) facilitates sample manipulation while maintaining a safe distance from the microscope objective.