d-vision swir spectrometer
d-vision swir spectrometer
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d-Vision SWIR Spectrometer | 500nm – 1700nm

Available Wavelength Range

500nm - 1700nm

Resolution

0.7nm - 3.1nm

Sensor

InGaAs CMOS

Integration Time

10μs - 1s

AD Converter

16-bit

Interface

USB Type-C

d-Vision VIS SWIR Spectrometer: Single-Sensor Broadband Coverage From 500nm to 1700nm

Experience the full spectral landscape with Sphere Photonics d-vision, an advanced single-sensor spectrometer engineered for comprehensive VIS–SWIR spectroscopic analysis. Covering an expansive wavelength range from 500 to 1700 nm in a single acquisition, d-vision SWIR spectrometer eliminates the need for detector switching or time-consuming spectrum stitching. The result is faster measurements, simplified workflows, and consistently reliable data across the entire spectral band.

At the heart of d-vision VIS-SWIR spectrometer is a precision-optimized optical design that combines broadband performance with exceptional spectral fidelity. Its carefully engineered architecture ensures high signal quality and outstanding stability, making it ideal for demanding analytical, industrial, and research applications. With various grating options, users can tailor performance to their needs, achieving spectral resolutions from 1 nm to 3 nm depending on configuration. This flexibility allows d-vision to adapt seamlessly to applications ranging from fine spectral feature identification to broad material characterization.

Despite its powerful capabilities, d-vision maintains a compact footprint. The integrated single-sensor approach reduces system complexity while enhancing robustness and alignment stability—delivering dependable operation in both laboratory and OEM environments. Its streamlined mechanical and optical design ensures long-term reliability without compromising measurement precision.


Key Features at a Glance

  • Broadband VIS–SWIR Coverage (500–1700 nm) – Capture the full spectrum in a single measurement

  • Single-Sensor Architecture – No detector switching or spectral stitching required

  • High Spectral Resolution (1–3 nm) – Selectable gratings for application-specific optimization

  • Compact Design – High performance in a space-saving footprint

  • High Signal Integrity & Stability – Precision optics for accurate, repeatable results

  • Flexible Integration – Ideal for laboratory setups, industrial systems, and OEM applications

  • Intuitive Software Platform – Real-time visualization and SDK for applications requiring integration

d-Vision VIS SWIR Spectrometer: Single-Sensor Broadband Coverage From 500nm to 1700nm

Experience the full spectral landscape with Sphere Photonicsd-vision, an advanced single-sensor spectrometer engineered for comprehensive VIS–SWIR spectroscopic analysis. Covering an expansive wavelength range from 500 to 1700 nm in a single acquisition, d-vision SWIR spectrometer eliminates the need for detector switching or time-consuming spectrum stitching. The result is faster measurements, simplified workflows, and consistently reliable data across the entire spectral band.

At the heart of d-vision VIS-SWIR spectrometer is a precision-optimized optical design that combines broadband performance with exceptional spectral fidelity. Its carefully engineered architecture ensures high signal quality and outstanding stability, making it ideal for demanding analytical, industrial, and research applications. With various grating options, users can tailor performance to their needs, achieving spectral resolutions from 1 nm to 3 nm depending on configuration. This flexibility allows d-vision to adapt seamlessly to applications ranging from fine spectral feature identification to broad material characterization.

Despite its powerful capabilities, d-vision maintains a compact footprint. The integrated single-sensor approach reduces system complexity while enhancing robustness and alignment stability—delivering dependable operation in both laboratory and OEM environments. Its streamlined mechanical and optical design ensures long-term reliability without compromising measurement precision.


Key Features at a Glance

  • Broadband VIS–SWIR Coverage (500–1700 nm) – Capture the full spectrum in a single measurement

  • Single-Sensor Architecture – No detector switching or spectral stitching required

  • High Spectral Resolution (1–3 nm) – Selectable gratings for application-specific optimization

  • Compact Design – High performance in a space-saving footprint

  • High Signal Integrity & Stability – Precision optics for accurate, repeatable results

  • Flexible Integration – Ideal for laboratory setups, industrial systems, and OEM applications

  • Intuitive Software Platform – Real-time visualization and SDK for applications requiring integration

SWIR Spectrometer Applications

The d-Vision VIS–SWIR spectrometer (500–1700 nm) is the perfect tool for applications across research, industrial, and applied science fields due to its ability to detect both visible and near-infrared spectral features. Because the VIS–SWIR range captures both visible color information and near-infrared molecular absorption features, these spectrometers are particularly valuable in applications requiring material discrimination, chemical composition analysis, and non-destructive testing.


Material Identification & Characterization

  • Polymer and plastic identification

  • Mineral and geological analysis

  • Thin-film and coating characterization

  • Semiconductor and wafer inspection


Agriculture & Food Analysis

  • Moisture content measurement

  • Sugar, fat, and protein analysis

  • Crop health and vegetation monitoring

  • Contaminant and foreign object detection

  • Sorting and quality grading


Chemical & Pharmaceutical Analysis

  • Raw material verification

  • Process monitoring (PAT)

  • Blend uniformity analysis

  • Reaction monitoring


Industrial Process Control

  • Inline quality control

  • Moisture and thickness monitoring

  • Color and consistency measurements

  • Waste sorting and recycling optimization


Environmental Monitoring

  • Water quality assessment

  • Soil composition analysis

  • Pollution detection

  • Remote sensing applications


Research & Scientific Applications

  • Optical component characterization

  • Laser and light source analysis

  • Reflectance and transmittance measurements

  • Academic spectroscopy research


d-Vision SWIR Spectrometer Software and SDK

Complementing the hardware is the intuitive d-vision software platform, designed to balance simplicity with analytical capability. The software delivers real-time spectral visualization, streamlined data acquisition, and comprehensive analysis tools within a clean, user-friendly interface. From quick routine measurements to advanced spectral evaluations, users benefit from an efficient workflow that reduces setup time and maximizes productivity.

For seamless system integration and custom application development, an optional SDK for Windows and Linux is available. The SDK provides full control of spectrometer functions, enabling developers and OEM partners to integrate d-vision directly into proprietary software environments, automation platforms, and industrial systems. This flexibility ensures that d-vision not only performs exceptionally as a standalone solution but also adapts effortlessly to advanced, application-specific requirements.

With d-vision, broadband VIS–SWIR spectroscopy becomes more accessible, efficient, and precise—transforming wide-range spectral measurement into a seamless, high-performance experience.

d-Vision Data Sheet

d-Vision SWIR spectrometer dimensions (mm)

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