CinCam CMOS | Entry Level Beam Profiler
Form factor
40mm x 40mm x 20mm
Small pitch available
2.2 µm
Largest active area available
7.2 x 5.4 mm
Wavelength Range
From 150nm (with UV option) to 1150nm
Software
RayCi Lite, Standard or Pro
SDK
C++, Python, LabVIEW
CinCam CMOS: A Cost-Effective Beam Profiler
The CinCam CMOS beam profiler is a cost-effective, high-performance solution designed for precise laser beam characterization in laboratory, research, and industrial environments. Optimized for excellent sensitivity, the CinCam CMOS features a megapixel-resolution sensor that delivers accurate, real-time beam analysis at frame rates of up to 20 frames per second. This enables reliable measurement of beam size, shape, position, and intensity distribution, even in dynamic or rapidly changing optical setups.
Its lightweight, compact design allows seamless integration into existing optical systems. The CinCam CMOS easily adapts to standard opto-mechanical components, optical benches, and imaging configurations, providing maximum flexibility for both permanent installations and portable measurement applications. Whether used for alignment, system validation, or ongoing process monitoring, the CinCam CMOS provides dependable performance in an accessible, entry-level platform.
The sensor is designed without cover glass, minimizing interference effects such as etalon fringes and ensuring higher measurement accuracy. Combined with its high resolution, wide dynamic range, and real-time monitoring capabilities, the CinCam CMOS offers exceptional value for users who require precise beam diagnostics without the complexity or cost of advanced profiling systems.
Key Features
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Compact, entry-level beam profiler ideal for laboratory, educational, and industrial use
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High-resolution megapixel CMOS sensor without cover glass for improved accuracy and reduced interference artifacts
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Real-time beam monitoring with up to 20 fps and wide dynamic range for accurate analysis of static and dynamic beams
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Compact and lightweight design for easy integration into optical setups and opto-mechanical systems
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Standard high-speed USB 2.0 connectivity for simple data transfer and straightforward plug-and-play operation
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Flexible software options available in Lite, Standard, and Professional versions to match different analysis requirements
Typical Applications
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Laser beam profiling and characterization
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Optical system alignment and optimization
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Research and development laboratories
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Industrial laser system setup and maintenance
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Educational and academic training environments
The CinCam CMOS provides an ideal balance of performance, simplicity, and affordability, making it an excellent choice for users seeking reliable beam profiling in a compact and versatile package.
Available to buy online on our online store
To learn more about laser beam profiling applications, visit our application page here.
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| CinCam CMOS series | ||||
|---|---|---|---|---|
| CMOS-1201 | CMOS-1202 | CMOS-1203 | CMOS-1204 | |
| Buy Online | Yes | No | No | No |
| Sensor Active area (mm²) | 6.7 x 5.3 | 6.8 x 5.4 | 7.2 x 5.4 | 5.7 x 4.3 |
| Pixel pitch | 5.2 µm | 5.3 µm | 4.5 µm | 2.2 µm |
| Min beam size | 52 µm | 53 µm | 45 µm | 22 µm |
| Max beam size (Gaussian) | ~4 mm | ~4.1 mm | ~4 mm | ~3.2 mm |
| Spectral range* | Std, RT, UV, IR | Std, RT, UV, IR | Std, RT, UV, IR | Std, RT, UV |
| Laser mode | CW | CW or pulsed | CW or pulsed | CW |
| Shutter | Rolling | Global | Global | Rolling |
| Trigger | - | TTL-Signal | TTL-Signal | - |
| Bit depth | 8-bit | 8-bit | 8-bit | 8-bit |
| Dynamic Range | 68dB (1:2500) | 62dB (1:1250) | 62dB (1:1250) | 70dB (1:3150) |
| Dimensions | 40mm x 40mm x 20mm | 40mm x 40mm x 20mm | 40mm x 40mm x 20mm | 40mm x 40mm x 20mm |
| Interface | USB 2.0 | USB 2.0 | USB 2.0 | USB 2.0 |
*Wavelength Range:
Std: absorptive built-in ND filter: 400nm – 1320nm or 400 – 1150nm
RT: reflective  built-in ND filter: 320nm – 1150nm
UV: phosphor sensor coating: <150nm – 1150nm
IR: phosphor sensor coating: 1470nm – 1605nm
CMOS Beam Profiler Applications
- Laser beam analysis of CW and pulsed lasers
- Alignment of lasers in production
- Quick control of laser modes and adjustment errors
- Near-field and far-field analysis of lasers
- Msquare measurement
RayCi Software for Beam Profilers
RayCi is a dedicated laser beam profiler software that utilizes newly developed correction algorithms and incomparable visualizations modes. This ensures the highest accuracy in beam profile analysis according to ISO standards. (ISO conformity: ISO 11145, 11146, 11554, 11670, 13694)
RayCi has different versions available:
– RayCi-Lite
– RayCi-Standard (Includes SDK)
– RayCi-Professional (includes SDK, beam quality / M2 measurement and simultaneous multi-camera measurements)
Please see specification tab for more information on versions.
Also be sure to visit our laser beam profiling application page to learn more and our online store to purchase select beam profilers directly.
Cross Section Analysis – 1D Beam Width / Edge Steepness
Percentage of Peak:
RayCi supports the most commonly used ‘percentage of peak’ method to determine the width from the beam cross section line. Therefore, two opposite markers are positioned automatically to the specified intensity level. The distance between the markers are used to define the beam width. Two pairs of markers can be used simultaneously to compare different settings.  To expand the beam analysis level and roughness options with statistical values are available
Edge Steepness:
Cross section lines of beam profiles are of particular interest for further beam analysis. Especially for flat-top beams the knowledge of the edge steepness is of great importance. RayCi defines the edge steepness of such beams by using different options.
2D Beam Width Analysis
RayCi beam profiler software supports several 2D techniques to determine the beam width of a laser beam. The customer can choose the best technique for their application. This extensive tool on beam width techniques is unique on the market for laser beam profiling.
- 2nd moments (D4s)

- Gauss/super gauss
- Knife edge/moving slit
- Plateau/geometry/area
Visualization Tool
| Multiple AOIs |
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| 2D-View |
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| 3D-View |
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| Histogram |
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| Cross Section |
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| Beam Result |
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Measurement Tool
| Snapshot Single Measurement Time Series |
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| Pointing Stability: |
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| Beam Stability |
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| Divergence Measurement |
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| Beam Quality M2 |
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Options
- RT Option : Reflective Type  320-1150 nm or 320 -1320 nm
- UV Option: Sensor Coating (<150-1150nm) / without Microlenses (240-1150nm)
- NIR Option: Sensor Coating (1495-1595nm)
- RayCi Lite, RayCi Standard (includes Labview SDK) or RayCi Pro software versions ( see Ray-Ci brochure for details)





















