RFLEX 2 wavefront metrology system
RFLEX 2 wavefront metrology system
RFLEX 2 - wavefront metrology system setups
RFLEX POP SAMBA
RFLEX 2 wavefront metrology system

R-FLEX I Wavefront Metrology System

Spectral Bandwidth

400 - 1100 nm / 1100 - 1700 nm

F/#

from 0.87 up to 63

Sampling points

Up to 21,000 / 1280

Accuracy

λ/200

Acquisition frequency

Up to 1 kHz / 150 Hz

RFLEX 2 – Flexible self-illuminated wavefront metrology system for optical characterization and alignment

 

RFLEX 2 wavefront metrology systems are made of a HASO Shack-Hartmann wavefront sensor, a collimator and a focusing module. Therefore, the RFLEX 2 provides users with a versatile and turnkey solution for precision characterization of optical systems and surfaces. The standard accuracy is of λ/100 RMS (λ/200 RMS in double pass configurations). It is insensitive to vibrations or atmospheric turbulence so users can perform measurements that meet the most stringent requirements for reliable, repeatable results. Even more, accuracy can be further increased if the measured aberration is close to the diffraction limit.

RFLEX 2 wavefront metrology system
Measurement of a flat mirror using the RFLEX 2 wavefront metrology system and a HASO LIFT 680

Because different users have different needs, the f/# of the RFLEX2 wavefront metrology system can be adapted to each user’s requirements by choosing the focusing module best suited for the task at hand. As the sample f/# defines the best focusing module, Imagine Optic offers factory models that are available from f/#=1 to f/#=15 to ensure maximum sampling points, whereas custom models for special needs can equally be delivered.

Characterizing large optical components or complex systems is performed easily as the exit beam is divergent, thereby allowing users to set the focal spot to any point. When set at the centre of concave mirrors, surface defects can be measured and analyzed.

RFLEX 2 - wavefront metrology system setups
RFLEX 2 – wavefront metrology system setups

The RFLEX2 wavefront metrology system is delivered with WaveView, its wavefront measurement and analysis dedicated software that runs under Windows 10. It displays aberrations in real-time so that users can immediately see the effects of various positioning or alignment adjustments.

wavefront metrology system - RFLEX2
Waveview4 – Measurement of a flat mirror with the HASO LIFT 680 and the RFLEX2

Manufacturer’s website: www.imagine-optic.com

The RFLEX 2 wavefront metrology system is compatible with all our wavefront sensors: here. 

RFLEX 2 

  • Wavefront characterization of optical systems in double-pass and single pass configuration
  • Optical surfaces inspections
  • Characterization of chromatic aberrations
  • Telescope alignment and determination of best focal plane
  • MTF and polychromatic MTF measurement
  • Alignment of complex optical systems

R FLEX 2 SWIR 

  • Analyze the transmitted wavefront of optical systems with double-pass configuration
  • Characterize optical surfaces
  • Characterize chromatic aberrations
  • Telescope alignment and wavefront error measurement

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