R-FLEX I Wavefront Metrology System
Spectral Bandwidth
400 - 1100 nm / 1100 - 1700 nm
F/#
from 0.87 up to 63
Sampling points
Up to 21,000 / 1280
Accuracy
λ/200
Acquisition frequency
Up to 1 kHz / 150 Hz
RFLEX 2 – Flexible self-illuminated wavefront metrology system for optical characterization and alignment
RFLEX 2 wavefront metrology systems are made of a HASO Shack-Hartmann wavefront sensor, a collimator and a focusing module. Therefore, the RFLEX 2 provides users with a versatile and turnkey solution for precision characterization of optical systems and surfaces. The standard accuracy is of λ/100 RMS (λ/200 RMS in double pass configurations). It is insensitive to vibrations or atmospheric turbulence so users can perform measurements that meet the most stringent requirements for reliable, repeatable results. Even more, accuracy can be further increased if the measured aberration is close to the diffraction limit.

Because different users have different needs, the f/# of the RFLEX2 wavefront metrology system can be adapted to each user’s requirements by choosing the focusing module best suited for the task at hand. As the sample f/# defines the best focusing module, Imagine Optic offers factory models that are available from f/#=1 to f/#=15 to ensure maximum sampling points, whereas custom models for special needs can equally be delivered.
Characterizing large optical components or complex systems is performed easily as the exit beam is divergent, thereby allowing users to set the focal spot to any point. When set at the centre of concave mirrors, surface defects can be measured and analyzed.

The RFLEX2 wavefront metrology system is delivered with WaveView, its wavefront measurement and analysis dedicated software that runs under Windows 10. It displays aberrations in real-time so that users can immediately see the effects of various positioning or alignment adjustments.

Manufacturer’s website: www.imagine-optic.com
The RFLEX 2 wavefront metrology system is compatible with all our wavefront sensors: here.Â
RFLEX 2Â
- Wavefront characterization of optical systems in double-pass and single pass configuration
- Optical surfaces inspections
- Characterization of chromatic aberrations
- Telescope alignment and determination of best focal plane
- MTF and polychromatic MTF measurement
- Alignment of complex optical systems
R FLEX 2 SWIRÂ
- Analyze the transmitted wavefront of optical systems with double-pass configuration
- Characterize optical surfaces
- Characterize chromatic aberrations
- Telescope alignment and wavefront error measurement
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| Compatibility with HASO Wavefront sensor and F/# | ||||
|---|---|---|---|---|
| HASO 126 VIS* | HASO4 Broadband | HASO4 FIRST | HASO4 FAST | |
| Number of microlenses | Up to 21420 ( 126 x 170) | Up to 3400 (50 x 68) | Up to 1280 (32 x 40) | Up to 256 (16 x 16) |
| Maximum acquisition frequency ( Hz) | 30 | 20 | 99 | 1000 |
| Module name | F number | F number | F number | F number |
| MOD F20 | - | 3.8 | 5.6 | 16.8 |
| MOD F31 | 3.0 | 6.0 | 8.6 | 26.1 |
| MOD F40 | 3.9 | 7.7 | 11.1 | 33.6 |
| MOD F50 | 4.9 | 9.6 | 13.9 | 42.0 |
| MOD F60 | 5.8 | 11.5 | 16.7 | 50.4 |
| MOD F75 | 7.3 | 14.4 | 29.8 | 63.0 |
| MOD F4.5 AFOx1 + MOD50-1 | - | 0.87 | 1.25 | 3.78 |
| MOD F9 AFOx1 + MOD50-2 | - | 1.73 | 2.5 | 7.56 |
| MOD F9 HR AFOx0.5 + MOD50-1 | 0.87 | |||
| MOD F18 HR AFOx0.5 + MOD50-2 | 1.73 |
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| Focusing module specifications | ||
|---|---|---|
| Focal length (mm) | Required power back (%) | |
| MOD F20 | 20 | 4 |
| MOD F31 | 31 | 4 |
| MOD F40 | 40 | 4 |
| MOD F50 | 50 | 4 |
| MOD F60 | 60 | 4 |
| MOD F75 | 75 | 4 |
| AFOx0.5 | Infinity | - |
| AFOx1 | Infinity | - |
| MOD F4.5 AFOx1 + MOD50-1 | 4.5 | 80 |
| MOD F9 AFOx1 + MOD50-2 | 9 | 80 |
| MOD F9 HR AFOx0.5 + MOD50-1 | 9 | 80 |
| MOD F18 HR AFOx0.5 + MOD50-2 | 18 | 80 |
RFLEX 2Â
- Wavefront characterization of optical systems in double-pass and single pass configuration
- Optical surfaces inspections
- Characterization of chromatic aberrations
- Telescope alignment and determination of best focal plane
- MTF and polychromatic MTF measurement
- Alignment of complex optical systems
RFLEX 2 SWIRÂ
- Analyze the transmitted wavefront of optical systems with double-pass configuration
- Characterize optical surfaces
- Characterize chromatic aberrations
- Telescope alignment and wavefront error measurement
Axiom Optics Blogs
- Aligning Optics With A Wavefront Sensor: The Off Axis Parabola Example
- Multi-Wavelength Optical Metrology With A Supercontinuum Laser
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Lin, W.-C., Chang, S.-T., Chen, H.-L., Lin, Y.-W., Wang, C.-Y., & Sung, C.-K. (2020). Comparison of absolute low-spatial frequency surface figure measurement for spherical surfaces. Optical Engineering, 59(06), 1. https://doi.org/10.1117/1.OE.
59.6.064102 This publication is detailing a benchmark in term of accuracy and sensitivity to environmental conditions between a R-FLEX 128 and commercial Fizeau. -
Erdmann, M., & Pierot, D. (2012). The optical alignment of the two GAIA three mirror anastigmatic telescopes. In E. Armandillo, N. Karafolas, & B. Cugny (Eds.), Proc. SPIE (Vol. 10564, p. 105640Y). Ajaccio, Corsica, France: SPIE. https://doi.org/10.1117/12.
2309087 This publication describes the full alignment procedure of the dual telescope system of GAIA with R-FLEX -
Cheng, X., Morawe, C., Peffen, J.-C., & Zhang, L. (2014). Thermal expansion properties of thin multilayer films. In C. Morawe, A. M. Khounsary, & S. Goto (Eds.), Proc. SPIE (Vol. 9207, p. 920709). https://doi.org/10.1117/12.
2059583 In this publication a R-FLEX is used to characterize the deformation of several type of multilayer coatings in function of the temperature. -
Baturalp, T. B., Coverstone, V. L., Coppejans, R., Cao, J., Chung, Y.-W., Buchholz, D. B., & Ulmer, M. P. (2018). Membrane mirror evaluation of APERTURE: a precise extremely large reflective telescope using re-configurable elements. In H. A. MacEwen, M. Lystrup, G. G. Fazio, N. Batalha, E. C. Tong, & N. Siegler (Eds.), Proc. SPIE (Vol. 10698, p. 106981K). SPIE. https://doi.org/10.1117/12.
2309826Â In this publication a R-FLEX Vis is used to characterize the deployment of large membrane mirror
Accessories for RFLEX 2
Translation stages
Our ΘXΘY rotation stage for angular alignment or the 5-axis stage that provides 2-way rotation around X and Y axes as well as 3-way translation along X, Y and Z axes is a perfect complement to the HASO R-Flex system.
Software add-on
HASO R-Flex is delivered with WaveView software, which is a leading wavefront metrology software providing 180 independent features. We also offer optional software modules including MTF (Modulation Transfer Function) and PSF (Point Spread Function) that increase the functionality of HASO R-Flex system.
Reference mirrors
Spherical reference mirror (Ø20mm useful pupil, R=15mm, F/0.75) for the calibration of HASO R-Flex in double-pass measurement configuration Flat reference mirror for autocollimation. Several options are available in diameter and flatness.
Single-Mode Laser Source (SMLS)
For those who want to use their HASO R-Flex at different wavelengths, we provide additional single-mode diode lasers to further expand the versatility of the system. Please contact us if you prefer to use your own light source.
MS-LAMBDA Metrology Light Source
The MS-LAMBDA is a metrology light source designed for wavefront sensing applications. It generates a spherical wavefront, ensuring an optimal illumination path at any desired wavelength.



