Skylark Lasers - CW DPSS single frequency laser 1

Skylark 640 | Single Frequency CW DPSS VIS Laser

Output Power

up to 1,000 mW

Wavelength

640 nm

Spectral Bandwidth

≤ 500 kHz

Spatial Mode

TEM₀₀

Spectral Stability

± 0.2 pm (over 8 hours)

Coherence Length

> 100 m

Skylark 640 NX: 1 W Single-Frequency 640 nm CW DPSS Laser

The Skylark 640 NX from Skylark Lasers is a single-frequency, continuous-wave, diode-pumped solid-state (DPSS) laser that delivers up to 1 W at 640 nm in a TEM00 beam. With a spectral bandwidth of 500 kHz or less and a coherence length beyond 100 m, it gives holography, interferometry, Raman and Brillouin spectroscopy, and flow cytometry a red source with the line purity and stability usually associated with green DPSS lasers.

Up to 1,000 mWCW output power
640 nmwavelength
≤ 500 kHzspectral bandwidth
TEM00spatial mode
±0.2 pmwavelength stability, 8 hours
> 100 mcoherence length

Why a single-frequency laser at 640 nm

Most red sources run on several longitudinal modes at once, which spreads their output across a band of frequencies and limits coherence to millimeters or centimeters. The Skylark 640 NX oscillates on a single longitudinal mode, so the beam stays coherent over path differences of meters. That is what lets a hologram record deep scenes, an interferometer hold fringes over long reference arms, and a Raman or Brillouin system resolve shifts without any broadening from the source.

The 640 nm wavelength adds its own advantages. Compared with 532 nm, red excitation lowers the fluorescence background in many samples. Compared with 785 nm, it produces roughly twice the Raman signal, and it keeps Raman lines well inside the sensitive range of silicon CCD and CMOS detectors. In flow cytometry, 640 nm is a standard line for exciting far-red fluorophores.

Stable power, stable wavelength

Skylark Lasers builds the 640 NX on its NX opto-mechanical platform, designed for ultra-stable single-frequency output across the company’s wavelength range. The result is output that holds steady over a full working day:

  • Output power stability: ≤ 2.0% over 8 hours
  • Output power noise: ≤ 0.3% RMS (10 Hz to 10 MHz)
  • Spectral bandwidth: ≤ 500 kHz
  • Wavelength stability: ±0.2 pm over 8 hours

For long exposures, overnight interferometric measurements or quantitative spectroscopy, that stability means fewer recalibrations and data that can be compared run to run.

Explore what single-frequency performance means for your setup

Coherence and fringe visibility explorer

Interference only works while the two beams stay coherent. Choose a source linewidth and the path difference between the arms of your hologram or interferometer to see how much fringe contrast survives.

Source linewidth
Path difference
Fringe visibility100.0%
Coherence length (c/πΔν)191 m
Path difference for 90% visibility20 m

High-contrast fringes at a 1 mm path difference

Fringe visibility100.0%
Coherence length (c/πΔν)191 m
Path difference for 90% visibility20 m

High-contrast fringes at a 1 cm path difference

Fringe visibility99.9%
Coherence length (c/πΔν)191 m
Path difference for 90% visibility20 m

High-contrast fringes at a 10 cm path difference

Fringe visibility99.5%
Coherence length (c/πΔν)191 m
Path difference for 90% visibility20 m

High-contrast fringes at a 1 m path difference

Fringe visibility94.9%
Coherence length (c/πΔν)191 m
Path difference for 90% visibility20 m

High-contrast fringes at a 10 m path difference

Fringe visibility77.0%
Coherence length (c/πΔν)191 m
Path difference for 90% visibility20 m

Usable, reduced contrast at a 50 m path difference

Fringe visibility100.0%
Coherence length (c/πΔν)19 m
Path difference for 90% visibility2.0 m

High-contrast fringes at a 1 mm path difference

Fringe visibility99.9%
Coherence length (c/πΔν)19 m
Path difference for 90% visibility2.0 m

High-contrast fringes at a 1 cm path difference

Fringe visibility99.5%
Coherence length (c/πΔν)19 m
Path difference for 90% visibility2.0 m

High-contrast fringes at a 10 cm path difference

Fringe visibility94.9%
Coherence length (c/πΔν)19 m
Path difference for 90% visibility2.0 m

High-contrast fringes at a 1 m path difference

Fringe visibility59.2%
Coherence length (c/πΔν)19 m
Path difference for 90% visibility2.0 m

Usable, reduced contrast at a 10 m path difference

Fringe visibility7.3%
Coherence length (c/πΔν)19 m
Path difference for 90% visibility2.0 m

Fringes washed out at a 50 m path difference

Fringe visibility99.9%
Coherence length (c/πΔν)1.9 m
Path difference for 90% visibility20.1 cm

High-contrast fringes at a 1 mm path difference

Fringe visibility99.5%
Coherence length (c/πΔν)1.9 m
Path difference for 90% visibility20.1 cm

High-contrast fringes at a 1 cm path difference

Fringe visibility94.9%
Coherence length (c/πΔν)1.9 m
Path difference for 90% visibility20.1 cm

High-contrast fringes at a 10 cm path difference

Fringe visibility59.2%
Coherence length (c/πΔν)1.9 m
Path difference for 90% visibility20.1 cm

Usable, reduced contrast at a 1 m path difference

Fringe visibility0.5%
Coherence length (c/πΔν)1.9 m
Path difference for 90% visibility20.1 cm

Fringes washed out at a 10 m path difference

Fringe visibility0.0%
Coherence length (c/πΔν)1.9 m
Path difference for 90% visibility20.1 cm

Fringes washed out at a 50 m path difference

Fringe visibility99.0%
Coherence length (c/πΔν)9.5 cm
Path difference for 90% visibility1.0 cm

High-contrast fringes at a 1 mm path difference

Fringe visibility90.1%
Coherence length (c/πΔν)9.5 cm
Path difference for 90% visibility1.0 cm

High-contrast fringes at a 1 cm path difference

Fringe visibility35.1%
Coherence length (c/πΔν)9.5 cm
Path difference for 90% visibility1.0 cm

Weak fringes at a 10 cm path difference

Fringe visibility0.0%
Coherence length (c/πΔν)9.5 cm
Path difference for 90% visibility1.0 cm

Fringes washed out at a 1 m path difference

Fringe visibility0.0%
Coherence length (c/πΔν)9.5 cm
Path difference for 90% visibility1.0 cm

Fringes washed out at a 10 m path difference

Fringe visibility0.0%
Coherence length (c/πΔν)9.5 cm
Path difference for 90% visibility1.0 cm

Fringes washed out at a 50 m path difference

Fringe visibility35.1%
Coherence length (c/πΔν)0.95 mm
Path difference for 90% visibility0.10 mm

Weak fringes at a 1 mm path difference

Fringe visibility0.0%
Coherence length (c/πΔν)0.95 mm
Path difference for 90% visibility0.10 mm

Fringes washed out at a 1 cm path difference

Fringe visibility0.0%
Coherence length (c/πΔν)0.95 mm
Path difference for 90% visibility0.10 mm

Fringes washed out at a 10 cm path difference

Fringe visibility0.0%
Coherence length (c/πΔν)0.95 mm
Path difference for 90% visibility0.10 mm

Fringes washed out at a 1 m path difference

Fringe visibility0.0%
Coherence length (c/πΔν)0.95 mm
Path difference for 90% visibility0.10 mm

Fringes washed out at a 10 m path difference

Fringe visibility0.0%
Coherence length (c/πΔν)0.95 mm
Path difference for 90% visibility0.10 mm

Fringes washed out at a 50 m path difference

Illustrative model for a Lorentzian line, where visibility falls as exp(−πΔνΔL/c). Comparison linewidths are generic values, not specific products. Real setups also lose contrast to vibration, polarization mismatch and unequal beam intensities.

Raman excitation calculator: 532 vs 640 vs 785 nm

Pick an excitation wavelength and a Raman band to see where the scattered line lands, how strong it is relative to 640 nm excitation, and whether a silicon detector can see it.

Excitation wavelength
Raman band
Silicon detector, high QEQE falling50060070080090010001100Laser 532 nmRaman 547.1 nmnm

Raman line547.1 nm
Shift520 cm-1
Scattering strength (ν4)2.14x the 640 nm signal

Inside the high-QE range of silicon CCD and CMOS detectors

Highest fluorescence risk of the three for many organic and biological samples.

Silicon detector, high QEQE falling50060070080090010001100Laser 532 nmRaman 561.9 nmnm

Raman line561.9 nm
Shift1001 cm-1
Scattering strength (ν4)2.19x the 640 nm signal

Inside the high-QE range of silicon CCD and CMOS detectors

Highest fluorescence risk of the three for many organic and biological samples.

Silicon detector, high QEQE falling50060070080090010001100Laser 532 nmRaman 580.8 nmnm

Raman line580.8 nm
Shift1580 cm-1
Scattering strength (ν4)2.26x the 640 nm signal

Inside the high-QE range of silicon CCD and CMOS detectors

Highest fluorescence risk of the three for many organic and biological samples.

Silicon detector, high QEQE falling50060070080090010001100Laser 532 nmRaman 629.0 nmnm

Raman line629.0 nm
Shift2900 cm-1
Scattering strength (ν4)2.44x the 640 nm signal

Inside the high-QE range of silicon CCD and CMOS detectors

Highest fluorescence risk of the three for many organic and biological samples.

Silicon detector, high QEQE falling50060070080090010001100Laser 532 nmRaman 649.5 nmnm

Raman line649.5 nm
Shift3400 cm-1
Scattering strength (ν4)2.52x the 640 nm signal

Inside the high-QE range of silicon CCD and CMOS detectors

Highest fluorescence risk of the three for many organic and biological samples.

Silicon detector, high QEQE falling50060070080090010001100Laser 640 nmRaman 662.0 nmnm

Raman line662.0 nm
Shift520 cm-1
Scattering strength (ν4)reference

Inside the high-QE range of silicon CCD and CMOS detectors

Red excitation sits between the two: lower fluorescence risk than 532 nm for many samples, with more Raman signal than 785 nm.

Silicon detector, high QEQE falling50060070080090010001100Laser 640 nmRaman 683.8 nmnm

Raman line683.8 nm
Shift1001 cm-1
Scattering strength (ν4)reference

Inside the high-QE range of silicon CCD and CMOS detectors

Red excitation sits between the two: lower fluorescence risk than 532 nm for many samples, with more Raman signal than 785 nm.

Silicon detector, high QEQE falling50060070080090010001100Laser 640 nmRaman 712.0 nmnm

Raman line712.0 nm
Shift1580 cm-1
Scattering strength (ν4)reference

Inside the high-QE range of silicon CCD and CMOS detectors

Red excitation sits between the two: lower fluorescence risk than 532 nm for many samples, with more Raman signal than 785 nm.

Silicon detector, high QEQE falling50060070080090010001100Laser 640 nmRaman 785.9 nmnm

Raman line785.9 nm
Shift2900 cm-1
Scattering strength (ν4)reference

Inside the high-QE range of silicon CCD and CMOS detectors

Red excitation sits between the two: lower fluorescence risk than 532 nm for many samples, with more Raman signal than 785 nm.

Silicon detector, high QEQE falling50060070080090010001100Laser 640 nmRaman 818.0 nmnm

Raman line818.0 nm
Shift3400 cm-1
Scattering strength (ν4)reference

Inside the high-QE range of silicon CCD and CMOS detectors

Red excitation sits between the two: lower fluorescence risk than 532 nm for many samples, with more Raman signal than 785 nm.

Silicon detector, high QEQE falling50060070080090010001100Laser 785 nmRaman 818.4 nmnm

Raman line818.4 nm
Shift520 cm-1
Scattering strength (ν4)43% of the 640 nm signal

Inside the high-QE range of silicon CCD and CMOS detectors

Lowest fluorescence risk of the three, at the cost of weaker Raman scattering.

Silicon detector, high QEQE falling50060070080090010001100Laser 785 nmRaman 851.9 nmnm

Raman line851.9 nm
Shift1001 cm-1
Scattering strength (ν4)42% of the 640 nm signal

Inside the high-QE range of silicon CCD and CMOS detectors

Lowest fluorescence risk of the three, at the cost of weaker Raman scattering.

Silicon detector, high QEQE falling50060070080090010001100Laser 785 nmRaman 896.1 nmnm

Raman line896.1 nm
Shift1580 cm-1
Scattering strength (ν4)40% of the 640 nm signal

Inside the high-QE range of silicon CCD and CMOS detectors

Lowest fluorescence risk of the three, at the cost of weaker Raman scattering.

Silicon detector, high QEQE falling50060070080090010001100Laser 785 nmRaman 1016.4 nmnm

Raman line1016.4 nm
Shift2900 cm-1
Scattering strength (ν4)36% of the 640 nm signal

Silicon QE falling steeply here; usable to about 1100 nm

Lowest fluorescence risk of the three, at the cost of weaker Raman scattering.

Silicon detector, high QEQE falling50060070080090010001100Laser 785 nmRaman 1070.8 nmnm

Raman line1070.8 nm
Shift3400 cm-1
Scattering strength (ν4)34% of the 640 nm signal

Silicon QE falling steeply here; usable to about 1100 nm

Lowest fluorescence risk of the three, at the cost of weaker Raman scattering.

At 640 nm, the Skylark 640 NX wavelength stability of ±0.2 pm equals about ±0.005 cm-1, and its 500 kHz linewidth equals about 0.00002 cm-1, far below the resolution of any Raman spectrometer. Relative strength uses the ν4 dependence of scattered intensity and ignores detector QE and sample effects.

Skylark 640 NX applications

Holography and grating masteringLong coherence keeps fringe contrast high across large object depths and long reference paths.
Interferometry and metrologyA narrow, stable line holds fringes steady over meters of path difference and hours of measurement.
Raman spectroscopyRed excitation balances signal strength against fluorescence, with a line far narrower than any spectrometer resolves.
Brillouin scatteringGigahertz-scale Brillouin shifts need a source linewidth well below the shift being measured.
Flow cytometry640 nm is a standard red excitation line for far-red fluorophores, and low noise keeps event-to-event signals consistent.
Optical manipulationA clean TEM00 beam with stable power gives predictable trapping and steering forces.

Skylark 640 NX FAQ

What is a single-frequency DPSS laser?

A single-frequency laser oscillates on one longitudinal mode, so its output occupies a very narrow band of optical frequencies. The Skylark 640 NX from Skylark Lasers is a diode-pumped solid-state (DPSS) laser with a spectral bandwidth of 500 kHz or less, which gives a coherence length of more than 100 m.

What is the coherence length of the Skylark 640 NX?

Skylark Lasers specifies a coherence length greater than 100 m. For a Lorentzian line 500 kHz wide, the common c/(πΔν) definition gives about 190 m, so interference fringes keep high contrast across path differences of meters.

How stable is the Skylark 640 NX?

Output power stability is 2.0% or better over 8 hours, output power noise is 0.3% RMS or better from 10 Hz to 10 MHz, and wavelength stability is ±0.2 pm over 8 hours.

Why use 640 nm for Raman spectroscopy instead of 532 nm or 785 nm?

Raman scattering strength rises with the fourth power of frequency, so 640 nm produces roughly twice the signal of 785 nm. Red excitation also lowers the fluorescence background compared with 532 nm for many samples, and the Raman lines up to the O-H stretch stay inside the sensitive range of silicon detectors.

What applications is the Skylark 640 NX used for?

Typical uses include holography and holographic grating mastering, interferometry and metrology, Raman and Brillouin spectroscopy, flow cytometry, and optical manipulation, where a narrow line, long coherence and stable power at a red wavelength matter.

How much power and what beam does the Skylark 640 NX deliver?

It delivers up to 1,000 mW of continuous-wave output at 640 nm in a TEM00 spatial mode.

Where can I buy the Skylark 640 NX?

Axiom Optics supplies and supports Skylark Lasers products from offices in Cambridge, Massachusetts and Orsay, France. Contact Axiom Optics for pricing, lead time and integration advice.

Axiom Optics supplies and supports Skylark Lasers single-frequency DPSS lasers from offices in Cambridge, Massachusetts and Orsay, France, and can help match wavelength, power and beam delivery to your system. Explore the full single-frequency DPSS laser range, including the Skylark 785 NX for NIR Raman and the Skylark 780 NX, or see our spectroscopy applications.

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